Sr Associate Engineer, Failure Analysis

2 weeks ago


Singapore GLOBALFOUNDRIES SINGAPORE PTE. LTD. Full time
Responsibilities:
  • Perform TEM (transmission electron microscopy) sample preparation using Focused-ion beam/Scanning Electron Microscope for semiconductor failure analysis and characterization.
  • Perform pre-FIB related sample preparation such as optical microscope inspection, Si wafer navigation, chip delayering, RIE etching, sputter coating, and etc.
  • Participate in new failure analysis techniques development and evaluation of new technologies
  • Demonstrate a sense of urgency and quality mindset to support urgent and critical Fab operation requests.
Requirements:
  • Diploma in Engineering (Electrical / Electronics / Mechatronics and Microelectronics Engineering)
  • This role requires to work in the 12hr night-shift pattern.
  • Fast learning and good hands-on capability
  • Hands-on experience on FIB for TEM sample preparation is preferred.
  • Basic knowledge in semiconductor field
  • Good interpersonal and communication skills, team workers, independent and self-disciplined.


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