Senior Engineer, Failure Analysis, NTI

Our vision is to transform how the world uses information to enrich life for all.

Join an inclusive team passionate about one thing: using their expertise in the relentless pursuit of innovation for customers and partners. The solutions we build help make everything from virtual reality experiences to breakthroughs in neural networks possible. We do it all while committing to integrity, sustainability, and giving back to our communities. Because doing so can fuel the very innovation we are pursuing.

Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever

We need someone who is passionate about detecting problems, making changes for the better, and seek out innovative ways in how predict device performance We are an equal opportunity company who values of People, Innovation, Customer Focus, Tenacity and Collaboration.

As Yield Failure Analysis Engineer in Micron NAND Technology Integration (NTI) Singapore department, you will be responsible for providing yield analysis for next-generation Micron products. In this exciting role, you will become a domain expert on physical failure analysis methods for any given electrical failure You will also participate in the identification and communication of yield issues, assist with the root cause analysis for process deviations, characterize, probe, parametric, and fabrication data to identify the sources of failures.

Job Responsibility:

• Perform Failure analysis which includes conducting electrical characterization, perform electrical verification to confirm failures, and understanding PFA techniques available for de-processing failures
• Drive failure analysis initiatives for the yield enhancement team. Create and deliver new methodologies, capabilities, and innovative ways for failure analysis de-processing failures
• Participate in global meetings and present results to Product Development and Process Integrations teams
• Collaborate with metrology and RDA team to re-define and validate inline detection capability
• Assist and support the transfer documentation of layout/architecture fundamentals of new technology from R&D to manufacturing fab.
• Understand and follow all health, safety, and environmental procedures and requirements.

Requirement:

• Bachelor of Science or Master Degree in Electrical Engineering, Microelectronics, Material Science, Mechanical Engineering.
• 5 - 7 years experience in Failure Analysis or PFA, with includes conducting electrical characterization, perform electrical verification to confirm failures, understanding PFA techniques available for de-processing failures
• Fluency in Python, JavaScript, C or C++ is Windows, Linux, JMP statistic software is desirable.
• Drive failure analysis initiatives for the yield enhancement team. Create and deliver new methodologies, capabilities, and innovative ways for failure analysis de-processing failures

About Micron Technology, Inc.

We are an industry leader in innovative memory and storage solutions transforming how the world uses information to enrich life for all. With a relentless focus on our customers, technology leadership, and manufacturing and operational excellence, Micron delivers a rich portfolio of high-performance DRAM, NAND, and NOR memory and storage products through our Micron and Crucial brands. Every day, the innovations that our people create fuel the data economy, enabling advances in artificial intelligence and 5G applications that unleash opportunities — from the data center to the intelligent edge and across the client and mobile user experience.

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All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, gender identity, national origin, veteran or disability status.

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Micron Prohibits the use of child labor and complies with all applicable laws, rules, regulations, and other international and industry labor standards.

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